Masters Theses
Keywords and Phrases
1X-Reflect SFD; 2X-Thru SFD; AITT; De-Embedding; D Probe
Abstract
"In section 1, the procedures of 1X-Reflect smart fixture de-embedding (SFD), 1-port auto fixture removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and de-embedded results. The accuracy of fixture characterization and the de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full wave models are built to evaluate the FOM of the three methods, by comparing the scattering parameters (S-parameters) and time domain reflectometer (TDR). A test coupon for measuring USB-C cables is adopted to serve as a manufactured validation purpose.
In section 2, a physics-based circuit model for a novel differential probe without a nearby ground pin is built up to 20GHz. First, the SFD method is used to obtain the S-parameter of a differential probe in a full wave model to validate the effectiveness of this method. Second, real measurements are made to obtain the S-parameter of a differential probe. Furthermore, the one-to-one corresponding circuit model has been built to understand the physics of probes. A layout for the advance interconnect test tool (AITT) demo board is then designed to test probe characteristics and AITT software. Finally, the SFD method is applied to de-embed the test fixtures, and material information is extracted based on the de-embedded results"--Abstract, page iii.
Advisor(s)
Drewniak, James L.
Committee Member(s)
Fan, Jun, 1971-
Khilkevich, Victor
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
Missouri University of Science and Technology
Publication Date
Spring 2018
Pagination
ix, 51 pages
Note about bibliography
Includes bibliographical references (pages 47-50).
Rights
© 2018 Yuan Chen, All rights reserved.
Document Type
Thesis - Open Access
File Type
text
Language
English
Thesis Number
T 11273
Electronic OCLC #
1041858149
Recommended Citation
Chen, Yuan, "De-embedding method comparisons and physics based circuit model for high frequency D-probe" (2018). Masters Theses. 7757.
https://scholarsmine.mst.edu/masters_theses/7757