Masters Theses
Keywords and Phrases
Phase Measurement
Abstract
"Often Electromagnetic Interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and for far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as oscilloscopes (scope) and vector network analyzers (VNA). The study focusses on the development of a near-field scanning method using a SA to measure the phase of the device under test (DUT) signals.
The first part deals with the development of the method in software simulation tools and testing it under standard test conditions. The second part deals with the assembly of the measurement components - phase shifting cables, switches, attenuators and combiners. The measurement method is demonstrated by measuring the phase of the known signal. In the third part the measurement method is tested on a DUT having near field radiating sources. The measurements are performed and compared to the existing methods. This study introduces and optimizes SA based phase measurements and compares the results to oscilloscope and VNA based methods for sine waves and real EMI signals"--Abstract, page iii.
Advisor(s)
Pommerenke, David
Committee Member(s)
Fan, Jun, 1971-
Beetner, Daryl G.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
Missouri University of Science and Technology
Publication Date
Spring 2017
Pagination
x, 48 pages
Note about bibliography
Includes bibliographical references (pages 46-47).
Rights
© 2017 Shubhankar Marathe
Document Type
Thesis - Open Access
File Type
text
Language
English
Thesis Number
T 11103
Electronic OCLC #
992440969
Recommended Citation
Marathe, Shubhankar, "Spectrum analyzer based phase measurement for EMI scanning applications" (2017). Masters Theses. 7651.
https://scholarsmine.mst.edu/masters_theses/7651