Masters Theses
Keywords and Phrases
EMC; ESD; PDN; Soft failure
Abstract
"In this article, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software. After the soft errors are found, circuit modeling techniques are used to characterize the DUT. By running the circuit model, the soft error threshold can be predicted and the circuit model can be used to evaluate the performance of other ESD protection methods. In the end several methods are used to separate local soft-failures from distant errors related to noise on the power distribution network (PDN) is demonstrated. Two approaches are used, one passive and one active, which duplicate the noise on a system PDN caused by some intentional injection onto a second system where the intentional injection is not present"--Abstract, page iii.
Advisor(s)
Pommerenke, David
Committee Member(s)
Fan, Jun, 1971-
Zhang, Yaojiang
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
Missouri University of Science and Technology
Publication Date
Spring 2016
Pagination
x, 53 pages
Note about bibliography
Includes bibliographical references (page 52).
Rights
© 2016 Suyu Yang, All rights reserved.
Document Type
Thesis - Open Access
File Type
text
Language
English
Subject Headings
Electronic circuits -- Noise -- DetectionElectromagnetic interference -- DetectionElectric discharges -- DetectionElectromagnetic compatibility
Thesis Number
T 10900
Electronic OCLC #
952600705
Recommended Citation
Yang, Suyu, "ESD related soft error detection and root cause analysis" (2016). Masters Theses. 7530.
https://scholarsmine.mst.edu/masters_theses/7530