Masters Theses
Abstract
"As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, page ii.
Advisor(s)
Tracey, James H.
Committee Member(s)
Taylor, J. M.
Hatfield, Charles, 1920-1993
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
University of Missouri--Rolla
Publication Date
1970
Pagination
v, 43 pages
Note about bibliography
Includes bibliographical references (pages 118-121).
Rights
© 1970 Jeng-Chuan Kau, All rights reserved.
Document Type
Thesis - Open Access
File Type
text
Language
English
Subject Headings
Asynchronous circuits -- TestingSequential circuitsElectronic circuits -- Testing
Thesis Number
T 2530
Print OCLC #
6032874
Electronic OCLC #
872571294
Recommended Citation
Kau, Jeng-Chuan, "Fault detection in asynchronous sequential circuits" (1970). Masters Theses. 7132.
https://scholarsmine.mst.edu/masters_theses/7132