Masters Theses

Abstract

"This paper presents an algorithm for deriving an optimum test sequence for detecting faults in a synchronous machine. In this study, the flow table is used as a tool to generate the fault detection tests. The fault stuck-at-1 (or stuck-at-0 ) is said to be present when a permanent signal valued 1 (or 0) appears on a component of the machine. Only single faults are treated . The result of the procedure is one or more test sequences guaranteed to detect a set of faults (Fp). First, sequential machines with feedback lines as memory elements are considered . Then the memory elements are changed to R-S flip-flops. Finally, several suggestions for further work are made"--Abstract, Page ii.

Advisor(s)

Szygenda, Stephen A.

Committee Member(s)

Tracey, James H.
Ho, C. Y. (Chung You), 1933-1988

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

1970

Pagination

viii, 62 Pages

Note about bibliography

Includes bibliographical references (page 26).

Rights

© 1970 Chung-tao David Wang, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Subject Headings

Electronic digital computersSequential machine theoryFault-tolerant computing

Thesis Number

T 2325

Print OCLC #

6013560

Electronic OCLC #

844781067

Download

Share

 
COinS