Masters Theses

DLTS measurements of interface states in SOS devices and thermal annealing effect after gamma and neutron irradiations

Jenn-Mou Sun

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Fall 1988

Pagination

vii, 60 pages

Rights

© 1988 Jenn-Mou Sun, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Thesis Number

T 5786

Print OCLC #

19473148

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