Masters Theses
Abstract
"A present limitation to the testing of a physical subsystem within an analog simulation is that the analog computer must compute in real time. If it is necessary to time scale the simulation of the complete system, a physical subsystem of the complete subsystem may not be tested within the simulation. Therefore, a means of changing the time scale of the analog signal is needed to test a physical subsystem within a time scaled analog computer simulation.
In this thesis a means of time conversion by sampling the analog signal at one rate, storing the samples, and reading the samples out at another rate is presented. A closed loop test procedure is present ed which requires that the analog signal be converted to real time before applying to the physical subsystem under test, and the output of the subsystem is converted to computer time before being fed back into the analog- simulation. The effect of errors in time conversion on the entire system is also considered"--Abstract, p. ii
Advisor(s)
Chenoweth, Robert D.
Committee Member(s)
Richards, Earl F., 1923-
Smith, Lyman T.
Johnson, Charles A.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
University of Missouri at Rolla
Publication Date
1964
Pagination
vii, 54 pages
Note about bibliography
Includes bibliographical references (pages 52-53)
Rights
© 1964 Wayne F. Balsman, All rights reserved.
Document Type
Thesis - Open Access
File Type
text
Language
English
Thesis Number
T 1636
Print OCLC #
5959659
Recommended Citation
Balsman, Wayne F., "Real time testing with a time scaled analog computer." (1964). Masters Theses. 5641.
https://scholarsmine.mst.edu/masters_theses/5641