Keywords and Phrases
IBIS model [Input/output Buffer Information Specification]
"Conducted emissions, noise conducted out of integrated circuit pins, play an important role in determining the system level EMC performance. Characterizing conducted emissions from ICs is investigated and the corresponding noise models are developed in this thesis. Both simulation IBIS and measurement based methods for noise-model construction are studied. The constructed noise source model for a test IC is applied in system-level simulations and the calculated far field radiation is validated with measurements. The agreement in the simulated and measured results demonstrates the effectiveness of the constructed model for characterizing the conducted emissions from an IC I/O pin"--Abstract, page iii.
Fan, Jun, 1971-
Drewniak, James L.
Xiao, Hai, Dr.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
ix, 73 pages
© 2013 Shuai Jin, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Signal integrity (Electronics)
Integrated circuits -- Computer simulation
Electronic OCLC #
Jin, Shuai, "Constructing conducted emission models for integrated circuits" (2013). Masters Theses. 5448.