Constructing conducted emission models for integrated circuits

Author

Shuai Jin

Keywords and Phrases

IBIS model [Input/output Buffer Information Specification]

Abstract

"Conducted emissions, noise conducted out of integrated circuit pins, play an important role in determining the system level EMC performance. Characterizing conducted emissions from ICs is investigated and the corresponding noise models are developed in this thesis. Both simulation IBIS and measurement based methods for noise-model construction are studied. The constructed noise source model for a test IC is applied in system-level simulations and the calculated far field radiation is validated with measurements. The agreement in the simulated and measured results demonstrates the effectiveness of the constructed model for characterizing the conducted emissions from an IC I/O pin"--Abstract, page iii.

Advisor(s)

Fan, Jun, 1971-

Committee Member(s)

Drewniak, James L.
Xiao, Hai, Dr.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Fall 2013

Pagination

ix, 73 pages

Note about bibliography

Includes bibliographical references (pages 135-143).

Rights

© 2013 Shuai Jin, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Subject Headings

Electromagnetic interferenceSignal integrity (Electronics)Integrated circuits -- Computer simulation

Thesis Number

T 10402

Electronic OCLC #

870672562

Recommended Citation

Jin, Shuai, "Constructing conducted emission models for integrated circuits" (2013). Masters Theses. 5448.
https://scholarsmine.mst.edu/masters_theses/5448