"Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem.
A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and wide- range phase-shifting.
The complete universal field analyzer would consist of the probe and the electronics system. This thesis would focus on the realization of the electronics system"--Abstract, page iii.
DuBroff, Richard E.
Beetner, Daryl G.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Electromagnetic Compatibility (EMC) Laboratory
Missouri University of Science and Technology
x, 56 pages
© 2008 Yong Cheh Ho, All rights reserved.
Thesis - Open Access
Integrated circuits -- Design
Near-fields -- Measurement
Print OCLC #
Link to Catalog Record
Ho, Yong Cheh, "Universal electric and magnetic fields analyzer system" (2008). Masters Theses. 54.