Masters Theses

Author

Yong Cheh Ho

Abstract

"Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem.

A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and wide- range phase-shifting.

The complete universal field analyzer would consist of the probe and the electronics system. This thesis would focus on the realization of the electronics system"--Abstract, page iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

DuBroff, Richard E.
Jun, Fan
Beetner, Daryl G.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Publisher

Missouri University of Science and Technology

Publication Date

Spring 2008

Pagination

x, 56 pages

Note about bibliography

Includes bibliographical references (page 55).

Rights

© 2008 Yong Cheh Ho, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Subject Headings

Electromagnetic measurements
Integrated circuits -- Design
Near-fields -- Measurement

Thesis Number

T 9383

Print OCLC #

272356925

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