Masters Theses
Abstract
"Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem.
A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and wide- range phase-shifting.
The complete universal field analyzer would consist of the probe and the electronics system. This thesis would focus on the realization of the electronics system"--Abstract, page iii.
Advisor(s)
Pommerenke, David
Committee Member(s)
DuBroff, Richard E.
Jun, Fan
Beetner, Daryl G.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Publisher
Missouri University of Science and Technology
Publication Date
Spring 2008
Pagination
x, 56 pages
Note about bibliography
Includes bibliographical references (page 55).
Rights
© 2008 Yong Cheh Ho, All rights reserved.
Document Type
Thesis - Open Access
File Type
text
Language
English
Subject Headings
Electromagnetic measurements
Integrated circuits -- Design
Near-fields -- Measurement
Thesis Number
T 9383
Print OCLC #
272356925
Link to Catalog Record
Recommended Citation
Ho, Yong Cheh, "Universal electric and magnetic fields analyzer system" (2008). Masters Theses. 54.
https://scholarsmine.mst.edu/masters_theses/54
