"An investigation of the low voltage failure mechanism in multilayer ce" by Christopher John Brannon
 

Masters Theses

Abstract

"Enhanced leakage current was induced into multilayer ceramic capacitors by the introduction of micro-cracks. These cracks extended from the surface through the electrode layers and were formed by means of thermal shock. The capacitors were then exposed to a low voltage bias and a humid atmosphere. Results indicated that a simple electrolytic solution mechanism may be responsible for the increased conduction, and that the proposed dendritic growth mechanisms may be more complex than necessary"--Abstract, p. ii

Advisor(s)

Harlan U. Anderson

Committee Member(s)

Illegible Signature
Don M. Sparlin

Department(s)

Materials Science and Engineering

Degree Name

M.S. in Ceramic Engineering

Publisher

University of Missouri--Rolla

Publication Date

Fall 1986

Pagination

vii, 52 pages

Note about bibliography

Includes bibliographic references (pages 49-51).

Rights

© 1986 C. John Brannon, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Thesis Number

T 5406

Print OCLC #

15507125

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