"During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. This thesis shows novel implementations of powering the laser, leading to a small, low cost optical probe"--Abstract, page iii.
Drewniak, James L.
DuBroff, Richard E.
Electrical and Computer Engineering
M.S. in Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
University of Missouri--Rolla
ix, 53 pages
© 2006 Chong Ding, All rights reserved.
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Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b5795914~S5
Ding, Chong, "Optical in-circuit measurement system for immunity applications" (2006). Masters Theses. 3977.
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