Masters Theses
Abstract
"During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. This thesis shows novel implementations of powering the laser, leading to a small, low cost optical probe"--Abstract, page iii.
Advisor(s)
Pommerenke, David
Committee Member(s)
Drewniak, James L.
DuBroff, Richard E.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Publisher
University of Missouri--Rolla
Publication Date
Summer 2006
Pagination
ix, 53 pages
Note about bibliography
Includes bibliographical references (pages 51-52).
Rights
© 2006 Chong Ding, All rights reserved.
Document Type
Thesis - Restricted Access
File Type
text
Language
English
Subject Headings
ElectrodynamicsElectromagnetic devicesSemiconductor lasersShielding (Electricity)
Thesis Number
T 9042
Print OCLC #
85893274
Recommended Citation
Ding, Chong, "Optical in-circuit measurement system for immunity applications" (2006). Masters Theses. 3977.
https://scholarsmine.mst.edu/masters_theses/3977
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