Imperfections in a silicon crystal studied by the x-ray and density method

Author

Pierre Borgeaud

Abstract

"The study of imperfections in several crystals of silicon was conducted by the x-ray and density method"--Abstract, page 2.

Advisor(s)

Straumanis, Martin E., 1898-1973

Committee Member(s)

James, William Joseph
Lorey, G. Edwin
Johnson, Charles A.

Department(s)

Materials Science and Engineering

Degree Name

M.S. in Metallurgical Engineering

Publisher

Missouri School of Mines and Metallurgy

Publication Date

1960

Pagination

84 pages

Note about bibliography

Includes bibliographical references (pages 82-83).

Rights

© 1960 Pierre Borgeaud, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Subject Headings

Silicon -- DefectsSilicon -- Metallurgy

Thesis Number

T 1278

Print OCLC #

5931454

Electronic OCLC #

953998541

Recommended Citation

Borgeaud, Pierre, "Imperfections in a silicon crystal studied by the x-ray and density method" (1960). Masters Theses. 2667.
https://scholarsmine.mst.edu/masters_theses/2667