Radiation resistance testing of COTS CMOS chips against continuous gamma radiations

Author

Hiten Pravinchandra Dharavat

Keywords and Phrases

Commercial-off-the-shelf components (COTS)

Abstract

"Electronic components are used in natural radiation environment as well as in the ionizing radiation environment for research purposes. There are components available that are specifically manufactured for use in military and space applications to sustain high level of radiation. These components which are considered to be reliable for use in radiation environment are called "rad-hard components". In contrast to this there are commercial-off-the-shelf (COTS) components, which are readily and cheaply available but no specific effort is made to assure or even test the radiation resistance...This research thus proposes a risk management approach that can be followed in order to use COTS components in radiation environment."--Abstract, page iii.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Computer Engineering

Publisher

University of Missouri--Rolla

Publication Date

Summer 2004

Pagination

ix, 142 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2004 Hiten Pravinchandra Dharavat, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Subject Headings

Metal oxide semiconductors, Complementary -- Testing
Metal oxide semiconductors, Complementary -- Effect of radiation on

Thesis Number

T 8516

Print OCLC #

56590052

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

Recommended Citation

Dharavat, Hiten Pravinchandra, "Radiation resistance testing of COTS CMOS chips against continuous gamma radiations" (2004). Masters Theses. 2525.
https://scholarsmine.mst.edu/masters_theses/2525