Development of the embedded modulated scattering technique for dielectric material characterization
"This study investigates the use of combining an embedded modulated scattering technique, utilizing a PIN diode-loaded dipole (i.e., MST) probe, with traditional near-field microwave nondestructive testing techniques, utilizing open-ended rectangular waveguide probes, for determination of the dielectric properties of a material."--Abstract, page ii.
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
xviii, 268 pages
© 2003 Dana T. Hughes, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b5004082~S5
Hughes, Dana, "Development of the embedded modulated scattering technique for dielectric material characterization" (2003). Masters Theses. 2327.
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