Masters Theses
Development of the embedded modulated scattering technique for dielectric material characterization
Abstract
"This study investigates the use of combining an embedded modulated scattering technique, utilizing a PIN diode-loaded dipole (i.e., MST) probe, with traditional near-field microwave nondestructive testing techniques, utilizing open-ended rectangular waveguide probes, for determination of the dielectric properties of a material."--Abstract, page ii.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
University of Missouri--Rolla
Publication Date
Spring 2003
Pagination
xviii, 268 pages
Rights
© 2003 Dana T. Hughes, All rights reserved.
Document Type
Thesis - Citation
File Type
text
Language
English
Subject Headings
DielectricsModulation (Electronics)Nondestructive testing
Thesis Number
T 8259
Print OCLC #
53227931
Recommended Citation
Hughes, Dana, "Development of the embedded modulated scattering technique for dielectric material characterization" (2003). Masters Theses. 2327.
https://scholarsmine.mst.edu/masters_theses/2327
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