Determination of High Frequency Package Currents from Near-Field Scan Data

Xiaopeng Dong
Shaowei Deng
Daryl G. Beetner, Missouri University of Science and Technology
Todd H. Hubing, Missouri University of Science and Technology
Thomas Van Doren, Missouri University of Science and Technology

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1538

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Abstract