Delaunay Tessellation and Topological Regression: An Application to Estimating Product Properties from Spectroscopic Measurements
Abstract
The Delaunay Tessellation and Topological Regression is a Local Simplex Method for Multivariate Calibration. the Method, Developed within Computational Geometry Has Potential for Applications in Analytical Chemistry and Process Monitoring. This Study Investigates the Applicability of the Method for Estimating the Aromatic Composition in Light Cycle Oil (Lco) by Near Infrared (Nir) Spectroscopy. © 2009 Elsevier B.v. All Rights Reserved.
Recommended Citation
F. Corona et al., "Delaunay Tessellation and Topological Regression: An Application to Estimating Product Properties from Spectroscopic Measurements," Computer Aided Chemical Engineering, vol. 27, pp. 1179 - 1184, Elsevier, Jan 2009.
The definitive version is available at https://doi.org/10.1016/S1570-7946(09)70587-5
Department(s)
Engineering Management and Systems Engineering
Keywords and Phrases
Delaunay tessellation; Multivariate calibration; Nearestneighbor regression; Process monitoring
International Standard Serial Number (ISSN)
1570-7946
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Elsevier, All rights reserved.
Publication Date
01 Jan 2009
