Abstract
Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open stubs if the signal(s) does not transition the entire depth of the board. These open stubs can have a negative impact on signal transmission. This summary reports the investigation of the impact of the open via stubs in a typical backpanel design.
Recommended Citation
S. Deng et al., "Effects of Open Stubs Associated with Plated Through-Hole Vias in Backpanel Designs," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA), vol. 3, pp. 1017 - 1022, Institute of Electrical and Electronics Engineers (IEEE), Aug 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1349966
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2004: Aug. 9-13, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
FEM; Backpanel Designs; Differential Transmission Line; Equivalent Circuits; Eye Diagram; Finite Element Analysis; Open Stubs; Plated Through-Hole Vias; Printed Circuit Boards; Printed Circuit Design; Signal Transmission; Transmission Line Theory; Equivalent Circuit; Open Stub; Via; Differential Transmission Lines; Eye Diagrams; Data Transfer; Dielectric Materials; Dielectric Properties; Electric Lines; Electromagnetic Wave Transmission; Finite Element Method; Mathematical Models; Permittivity; Signal Theory; Signaling; Time Domain Analysis
International Standard Book Number (ISBN)
780384431
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2004
