Abstract

The StatCom is traditionally modeled for power flow analysis as a PV or PQ bus depending on its primary application. The active power is either set to zero (neglecting the StatCom losses) or calculated iteratively. The StatCom voltage and reactive power compensation are usually related through the magnetics of the StatCom. This traditional power flow model of the StatCom neglects the impact of the high-frequency effects and the switching characteristics of the power electronics on the active power losses and the reactive power injection (absorption). In this paper, the authors propose a new StatCom model appropriate for power flow analysis derived directly from the dynamic model of the StatCom. The proposed model can therefore account for the high-frequency effects and power electronic losses, and more accurately predict the active and reactive power outputs of the StatCom.

Meeting Name

2000 IEEE Power Engineering Society Summer Meeting (2000: Jul. 16-20, Seattle, WA)

Department(s)

Electrical and Computer Engineering

Sponsor(s)

National Science Foundation (U.S.)
Sandia National Laboratories

Comments

Supported by the National Science Foundation under Grants EEC-9527345 and ECS-9257208 and Sandia National Laboratories under contract BD-0071-D

Keywords and Phrases

FACTS Device; StatCom Magnetics; StatCom Model; Active Power; Active Power Losses; Active Power Outputs; Conduction Losses; Dynamic Model; Flexible AC Transmission Systems; Harmonic Losses; High-Frequency Effects; Load Flow; Losses; Power Electronics; Power Flow Analysis; Power Flow Model; Reactive Power; Reactive Power Compensation; Reactive Power Injection; Reactive Power Outputs; Static VAr Compensators; Switching Characteristics; Switching Losses; Voltage Compensation

International Standard Book Number (ISBN)

0-7803-6420-1

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jul 2000

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