Abstract
Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the test topology. Numerical models and measurements of a modified TEM cell demonstrate how higher order mode suppression techniques can extend the useful frequency range of a TEM cell for IC measurements from 1 to 2.5 GHz.
Recommended Citation
S. Deng et al., "An Experimental Investigation of Higher Order Mode Suppression in TEM Cells," IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers (IEEE), May 2008.
The definitive version is available at https://doi.org/10.1109/TEMC.2008.919028
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Higher Order Mode; Resonant Frequency; Slotted Septum; Transverse Electromagnetic (TEM) Cell
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2008
