Recommended Citation
L. Zhang et al., "A Solution for EAF Induced Problems in Bulk Power Systems by FACT/ESS," Proceedings of the IEEE Power Engineering Society General Meeting (2005, San Francisco, CA), pp. 1831 - 1838, Institute of Electrical and Electronics Engineers (IEEE), Jun 2005.
The definitive version is available at https://doi.org/10.1109/PES.2005.1489445
Meeting Name
IEEE Power Engineering Society General Meeting (2005: Jun. 12-16, San Francisco, CA)
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
0-7803-9157-8
International Standard Serial Number (ISSN)
1932-5517
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jun 2005