Abstract

The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded is presented. This formulation is based upon calculating the near-field coupling between the waveguide and the dipole as a mutual impedance.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Dielectric Material Characterization; PIN Diode-Loaded Dipole; Dielectric Half-Space; Dielectric Material Property; Dielectric Materials; Dielectric Measurement; Dielectric Properties; Electromagnetic Wave Reflection; Electromagnetic Wave Scattering; Embedded Modulated Scattering; Embedded Sensors; Forward Formulation; Microwave Measurement; Microwave Nondestructive Testing; Modulated Scattering Technique; Modulated Scattering Technique Probe; Near-Field Coupling; Near-Field Microwave Nondestructive Testing; Nondestructive Testing; Reflection Coefficient; Waveguide Aperture; Electromagnetic Formulation-Probe Development and Antennas; Material Characterization

International Standard Serial Number (ISSN)

0018-9456

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Dec 2005

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