Temporal Risk Forecasting Of Infrastructural Health Using Deep Learning With Attention Mechanism

Abstract

This paper introduces a unified deep learning framework for automated damage assessment and temporal risk forecasting in civil infrastructure, addressing both crack and corrosion deterioration. A Spectral Mixed Attention (SMA) Network is developed for pixel-level semantic segmentation by combining convolutional feature extraction, mixed attention, and a global context bottleneck to identify fine crack patterns and multi-class corrosion states under diverse surface conditions. To improve training stability, the framework incorporates an singular value decomposition (SVD)-based reparameterized optimization strategy that adjusts gradient updates in the spectral domain using reflector-based orthogonal factors, helping maintain directional consistency and robustness under challenging optimization conditions. Following segmentation, structural descriptors are extracted from the predicted damage regions: crack dimensions are quantified using skeletonization and distance transforms, while corrosion severity is evaluated using class-wise area estimation aligned with inspection-based condition states. These descriptors are arranged into temporal sequences and used by an LSTM-based forecasting model to predict Time-to-Attention (TTA). Experimental results show that the proposed SMA segmentation network achieves 71.2% MIoU on DeepCrack, corresponding to an 8.37% relative improvement over the best baseline MIoU, while the proposed learning strategy improves U-Net Dice and IoU by 7.86% and 12.76%, respectively, compared with the baseline.

Department(s)

Electrical and Computer Engineering

Second Department

Computer Science

Comments

Intelligent Systems Center, Grant 69A3552348339

Keywords and Phrases

Deep Learning; Infrastructural Health; LSTM; Mixed Attention; SVD optimizer; Time-to-Attention

International Standard Serial Number (ISSN)

2691-4581

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2026 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2026

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