Abstract
Electrostatic discharge (ESD) is a major source of electromagnetic interference, capable of causing damage, malfunctions, or disruptions in electronic devices. As a result, ESD immunity testing is a critical component of electromagnetic compatibility (EMC) standards. In this study, the radiation emitted from the ESD gun body over 2 GHz is characterized and modeled using Huygens' principle. The equivalent field source was validated across three different environments, demonstrating accuracy with errors of less than 10 dB. A coupling path visualization technique was then employed to identify critical coupling paths, providing guidance for the strategic placement of absorbers. Simulation results showed that applying absorbers to the identified critical areas could reduce coupling by up to 20 dB.
Recommended Citation
X. Su et al., "Coupling Path Analysis of Data Center Ssd Storage Systems based on Visualization Technique," IEEE International Symposium on Electromagnetic Compatibility, pp. 184 - 189, Institute of Electrical and Electronics Engineers, Jan 2025.
The definitive version is available at https://doi.org/10.1109/EMCSIPI52291.2025.11170206
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Absorber location optimization; Coupling path visualization; EMI; ESD gun; Huygens' principle
International Standard Serial Number (ISSN)
2158-1118; 1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2025 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2025
