Abstract
Frequency selective surfaces (FSSs) are planar arrays of patch- or aperture-based elements that have a particular transmissive or reflective response. As FSS performance is affected by changes in the local (to the FSS) environment, FSSs may be used to detect changes in strain, temperature, or nearby material (substructure) thickness, amongst other parameters. To this end, an aperture-based FSS can be considered as a sensor for substructure thickness monitoring for surface mounted sensing scenarios. An aperture-based design was selected due to its ability to operate in reflection mode (and hence a one-sided measurement) without the need for a conductive backplane. In this work, an X-band (8.2-12.4 GHz) aperture-based FSS was used to sense thickness changes of two substructures consisting of cardboard and FR-4. The results indicate that the sensor has a linear response when the both (cardboard and FR-4) substructures have a thickness of 3 mm or less. In addition, the sensitivity of the sensor improved by ~10% when the sensor substrate was matched to the substructure.
Recommended Citation
A. Hook et al., "Aperture-Based FSS for Dielectric Thickness Sensing," Conference Record IEEE Instrumentation and Measurement Technology Conference, Institute of Electrical and Electronics Engineers, Jan 2025.
The definitive version is available at https://doi.org/10.1109/I2MTC62753.2025.11078943
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Aperture-Based FSS; Frequency Selective Surface; FSS-Based Sensor; Thickness Sensing
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2025 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2025
