Abstract
An empirical modeling of contact nonlinearity-induced intermodulation (IM) effect on the coaxial connector is presented in this article. The IM weights on inner and outer conductors are clarified using the measurement method. The contact degeneration-induced IM evolution is quantized by considering the contact coupling effect between the inner and outer conductors. This article demonstrated a set of test methods to quantify the oxide-induced nonlinearity with contact degeneration effects, and these methods can evaluate the contact IM products and further predict the low IM lifetime of passive devices.
Recommended Citation
X. Chen et al., "Empirical Modeling of Contact Intermodulation Effect on Coaxial Connectors," IEEE Transactions on Instrumentation and Measurement, vol. 69, no. 7, pp. 5091 - 5099, article no. 8924674, Institute of Electrical and Electronics Engineers, Jul 2020.
The definitive version is available at https://doi.org/10.1109/TIM.2019.2957869
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Coaxial connectors; contact degeneration; passive intermodulation (IM); unstable nonlinearity
International Standard Serial Number (ISSN)
1557-9662; 0018-9456
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jul 2020
Comments
China Postdoctoral Science Foundation, Grant 61901296