Abstract
Aiming at realizing high-efficiency distributed strain sensing through optical frequency domain reflectometry (OFDR), this paper introduces a fast demodulation algorithm to determine strain-induced spectral shifts from coarse Rayleigh backscattering (RBS) cross-correlation spectra. The proposed approach employs an enhanced Buneman frequency estimation (BFE) algorithm, enabling direct spectral shift analysis across coarse signals. By applying this algorithm, the need for dense interpolation in the conventional cross-correlation demodulation process - typically required for a finer spectral sampling interval but at the cost of demodulation efficiency - can be eliminated. Both theoretical analysis and experimental investigation reveal the equivalence of the BFE and conventional algorithms in terms of underlying physical principles and resultant demodulation noise distribution, establishing a strong foundation for adopting the BFE algorithm to improve demodulation efficiency without sacrificing performance metrics. Demonstration experiments using identical hardware configurations show that the proposed BFE method enhances demodulation efficiency by over 17 times without sacrificing other performance metrics, confirming its effectiveness and practicality. This advancement holds promise for improving the practical application of OFDR-based distributed sensing systems.
Recommended Citation
Z. Zhang et al., "Fast Demodulation of OFDR-Based Distributed Sensing Based on Enhanced Buneman Frequency Estimation," Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers; Optica Publishing Group, Jan 2025.
The definitive version is available at https://doi.org/10.1109/JLT.2025.3531953
Department(s)
Electrical and Computer Engineering
Publication Status
Early Access
Keywords and Phrases
demoulation algorithm; distributed sensing; Optical frequency domain reflectometry
International Standard Serial Number (ISSN)
1558-2213; 0733-8724
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2025 Institute of Electrical and Electronics Engineers; Optica Publishing Group, All rights reserved.
Publication Date
01 Jan 2025
