Abstract

In the latest portable electronic devices, 5th generation double data rate small outline dual in-line memory modules (DDR5 SODIMMs) are more and more used and have been identified as one of the critical electromagnetic interferences (EMI) noise sources that could cause RF desensitization. In this paper, the radiation mechanism of DDR5 SODIMM deployed in a laptop is identified and investigated based on near-field scanning. It was found that a cavity formed by the SODIMM and the main board can generate strong radiation around 2.4 GHz due to their dimensions, which overlap with the Wi-Fi band. To quantify the radiation from the cavity, a waveguide probe was designed to perform quick measurements. The performance of the proposed probe showed better sensitivity compared to conventional loop probes. The designed probe was built and used to characterize 4 different SODIMMs from 3 manufacturers. The waveguide probe-measured noise was proportional to the coupled power on the Wi-Fi antenna with an accuracy of 3 dB.

Department(s)

Electrical and Computer Engineering

Comments

SK Hynix, Grant None

Keywords and Phrases

DDR5 SODIMM; near-field scanning; RFI; waveguide probe

International Standard Serial Number (ISSN)

2158-1118; 1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2024

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