Abstract
Characterizing the susceptibility of an IC while it is integrated within a system can be challenging. Characterization is even harder if one wants to know the waveform at the target IC pin when injecting a signal on the pin. In this work, the feasibility of a direct injection probe with a capacitively coupled return and integrated voltage monitor is proposed. This probe is advantageous because it does not need to be soldered to the test device and its ability to provide a measurement of the waveform on the target IC pin during the injection. Methods for reconstructing the pin waveform based on probe measurements are discussed. Initial results indicate that the presented probe is generally insensitive to landing position variations and can accurately provide the waveform at the target IC during an injection. Future work is focused on further validation of the presented probe.
Recommended Citation
A. Harmon et al., "On the Feasibility of a Direct Injection Probe with a Capacitively Coupled Return and Integrated Voltage Monitor," IEEE International Symposium on Electromagnetic Compatibility, pp. 151 - 156, Institute of Electrical and Electronics Engineers, Jan 2024.
The definitive version is available at https://doi.org/10.1109/EMCSIPI49824.2024.10705473
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Conducted Susceptibility; Direct Power Injection; HPEM; IEMI; Immunity; Susceptibility
International Standard Serial Number (ISSN)
2158-1118; 1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2024
