On-chip Sensors to Measure Level of Transient Events

Author

A. Patnaik
M. Suchak
R. Seva
K. Pamidimukkala
G. Edgington
R. Moseley
J. Feddeler
M. Stockinger
Daryl G. Beetner, Missouri University of Science and TechnologyFollow

Abstract

On-die circuits were developed to measure the size of transient electrical events experienced at I/O pads. The circuits allow an integrated circuit (IC) to determine the peak voltages across the electrostatic discharge diodes during the event. Experiments and simulations with a 90 nm test chip show the sensor can determine the peak magnitude of the transient event within 1 A for events larger than 0.7 A and duration longer than 1 ns.

Recommended Citation

A. Patnaik et al., "On-chip Sensors to Measure Level of Transient Events," Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Institute of Electrical and Electronics Engineers, Oct 2017.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Comments

National Science Foundation, Grant IIP-1440110

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

18 Oct 2017