Abstract
A set of Zn 1-x Cd x O thin films with different Cd concentrations was deposited on quartz substrates by Pulsed Laser Deposition (PLD). The properties of these films were investigated by variable angle and temperature dependent spectroscopic ellipsometry (SE). The experimental Zn 1-x Cd x O thin films showed a red shift in the absorption edge with increasing Cd contents at room temperature. For ZnCdO films with the similar Cd concentration, it has been found that the film thickness has important effects on the optical constants (n, k). The variations of optical constants (n, k) and the band gap, E 0 , with temperature (T) in 25 °C–600 °C for a typical Zn 0.95 Cd 0.05 O sample were obtained. The E 0 vs T relationship is described by a T- quadratic equation.
Recommended Citation
S. Chen et al., "Spectroscopic Ellipsometry Studies on ZnCdO Thin Films with Different Cd Concentrations Grown by Pulsed Laser Deposition," Applied Surface Science, vol. 421, pp. 383 - 388, Elsevier, Nov 2017.
The definitive version is available at https://doi.org/10.1016/j.apsusc.2017.02.264
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Bandgap; Optical constants; Spectroscopic ellipsometry; Variable temperature
International Standard Serial Number (ISSN)
0169-4332
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Elsevier, All rights reserved.
Publication Date
01 Nov 2017
Comments
National Natural Science Foundation of China, Grant 2013GXNSFFA019001