Abstract
3-D integrated circuits (3-D ICs) make use of the vertical dimension for smaller footprint, higher speed, lower power consumption, and better timing performance. In 3-D ICs, the inter-Tier-via (ITV) is a critical enabling technique because it forms vertical signal and power paths. Accordingly, it is imperative to accurately and efficiently extract the electrostatic capacitances of ITVs using field solvers. Unfortunately, the cylindrical via shape presents major challenges to most of the existing methods. To address this issue, we develop a novel floating random walk (FRW) method by rotating the transition cube to suit the cylindrical surface, devising a special space management technique, and proposing accelerating techniques for structures with large-sized through-silicon-vias. Experiments on typical ITV structures suggest that the proposed techniques are up to hundreds of times faster than a simple FRW approach and the boundary element method-based algorithms, without loss of accuracy. In addition, compared with extracting the square-Approximation structures, the proposed techniques can reduce the error by 10 \times. Large and Mult dielectric structures have also been tested to demonstrate the versatility of the proposed techniques.
Recommended Citation
C. Zhang et al., "Fast Random Walk based Capacitance Extraction for the 3-D IC Structures with Cylindrical Inter-Tier-Vias," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 34, no. 12, pp. 1977 - 1990, article no. 7117360, Institute of Electrical and Electronics Engineers, Dec 2015.
The definitive version is available at https://doi.org/10.1109/TCAD.2015.2440323
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Capacitance extraction; floating random walk method; monolithic inter-Tier via (MIV); three-dimensional (3D) IC
International Standard Serial Number (ISSN)
0278-0070
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Dec 2015