Fast and Accurate Interrogation of Vernier Effect-Based Optical Fiber Sensors Enabled by Machine Learning

Abstract

The possibility of employing a light source with a small wavelength bandwidth (35 nm) and a coarsely resolved spectrometer (~166 pm) for the interrogation of a Vernier effect-based high-sensitivity optical fiber sensor is demonstrated.

Department(s)

Electrical and Computer Engineering

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Optica Publishing Group, All rights reserved.

Publication Date

01 Jan 2024

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