Experimental Verification of Worst-Case Waveform Coupling to a Loaded System

Abstract

Waveforms that maximize coupling to linear loads have been theoretically synthesized but have not been experimentally validated. These waveforms can be calculated using the device's frequency domain transfer function. This work aims to experimentally validate the RF coupling performance of these theoretical worst-case waveforms to a device composed of concentric copper loops loaded with a nonlinear diode. Experimental results show that the worst-case broadband excitation generates a coupled voltage double that of narrowband excitation. However, the same waveform only couples 25% of the energy of a narrowband waveform centered at the peak of the device's transfer function. This work provides the first experimental validation of the coupling performance of optimized waveforms.

Department(s)

Electrical and Computer Engineering

Comments

Defense Advanced Research Projects Agency, Grant None

International Standard Book Number (ISBN)

978-173350967-1

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2024

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