Fast and Accurate Multi-layer PDN Analysis for Power Integrity and EMC
Abstract
This work has shown that very complex via arrays, combined with many layers and cavities, and combined with many capacitors can quickly be analyzed using this technique. the simplest cases (which were still complex with many layers) solved in a few minutes, while the most complex cases with many vias and capacitors solved in 6-8 hours. Normal full wave tools would likely not be able to solve the complex problems at all, unless massive parallelization is used and extremely long run times. Copyright© (2010) by IMAPS - International Microelectronics & Packaging Society.
Recommended Citation
B. Archambeault et al., "Fast and Accurate Multi-layer PDN Analysis for Power Integrity and EMC," 43rd International Symposium on Microelectronics 2010, IMAPS 2010, pp. 566 - 571, Scimago Journal and Country Rank, Dec 2010.
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-161782320-6
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Scimago Journal and Country Rank, All rights reserved.
Publication Date
01 Dec 2010