Abstract
In this paper, we propose a systematic framework for the optimization and analysis of the equivalent characteristic impedance of practical via structures. the framework consists of (a) optimizing via structures for impedance matching using a Genetic algorithm, and (b) numerically characterize, by Polynomial Chaos (PC) method, the sensitivity of the equivalent characteristic impedance to the manufacturing uncertainties in the various geometrical parameters of a via structure. the PC method can be effectively used to compute important statistical information, such as moments, probabilities and sensitivities with respect to the design variables. the PC method is straightforward to implement and can be orders of magnitude faster than the traditional Monte Carlo (MC) method. the proposed framework naturally leads to a rigorous methodology for EM design/control in the presence of multiple sources of uncertainty. © 2011 IEEE.
Recommended Citation
J. Shen et al., "Analysis of Via Impedance Variations with a Polynomial Chaos Method," IEEE International Symposium on Electromagnetic Compatibility, pp. 899 - 904, article no. 6038436, Institute of Electrical and Electronics Engineers, Oct 2011.
The definitive version is available at https://doi.org/10.1109/ISEMC.2011.6038436
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Optimization; Polynomial chaos method; Sparse grid method; Statistical analysis; Via impedance
International Standard Book Number (ISBN)
978-142444783-1
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
24 Oct 2011
