Jitter: Basics, Relevance and Measurement Methods

Author

David Pommerenke, Missouri University of Science and TechnologyFollow

Recommended Citation

D. Pommerenke, "Jitter: Basics, Relevance and Measurement Methods," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility 2008 (2008, Detroit, MI), Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.

Meeting Name

2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 (2008: Aug. 18-22, Detroit, MI)

Department(s)

Electrical and Computer Engineering

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

22 Aug 2008