Laser Optical In-Circuit Measurement System for Immunity Applications

Author

Ding Chong
David Pommerenke, Missouri University of Science and TechnologyFollow

Abstract

During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. the paper shows novel implementations of powering the laser, leading to a small, low cost optical probe. © 2006 IEEE.

Recommended Citation

D. Chong and D. Pommerenke, "Laser Optical In-Circuit Measurement System for Immunity Applications," IEEE International Symposium on Electromagnetic Compatibility, vol. 3, pp. 569 - 574, article no. 1706373, Institute of Electrical and Electronics Engineers, Dec 2006.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

EM coupling; Non-ideal shielding; Optical link; Susceptibility test

International Standard Book Number (ISBN)

978-142440293-9

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Dec 2006