Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

Abstract

Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board resulting in radiated emissions that are difficult or expensive to control. This paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

EMI; IC; Near-field Magnetic Scanning; VLSI

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

08 Oct 2004

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