Using a Reconfigurable Field Programmable Gate Array to Demonstrate Boundary Scan with Built in Self Test

Author

Hardy J. Pottinger, Missouri University of Science and TechnologyFollow
Chien Yuh Lin

Abstract

The XC4000 Logic Cell Array Family of Field Programmable Gate Array developed by Xilinx includes support for the IEEE Standard 1149.l Test Access Port and Boundary Scan Architecture. Boundary-scan with built-in self-test is known to provide tests of high quality. The design and implementation of boundary-scan with built-in self-test that conforms fully to the IEEE Standard 1149.1 for the XC4000 device is presented. Fault simulation was performed to evaluate the effectiveness of the built-in self-test. Hardware was realized with the XC4003PC84-6 used on the Xilinx demo board. The boundary scan and self test logic was controlled via the widely available parallel printer port of an IBM compatible PC. This results in an ideal hardware/software combination for use in teaching and demonstrating boundary scan and self test principles.

Recommended Citation

H. J. Pottinger and C. Y. Lin, "Using a Reconfigurable Field Programmable Gate Array to Demonstrate Boundary Scan with Built in Self Test," Proceedings of the IEEE Great Lakes Symposium on VLSI, pp. 242 - 245, Jan 1995.

Department(s)

Electrical and Computer Engineering

International Standard Serial Number (ISSN)

1066-1395

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 The Authors, All rights reserved.

Publication Date

01 Jan 1995