Abstract

We present an overview of challenge problems in electromagnetic modeling of highly complex and multi-scale structures found in 3D IC, SiP, SoC, and electronic packaging necessary for signal integrity assessment. © 2013 IEEE.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

3D IC; accurate; electromagnetics; fast; modeling; multiscale; signal integrity; SiP; SoP

International Standard Book Number (ISBN)

978-146735678-7

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

20 Aug 2013

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