Abstract
Nonintrusive electromagnetic interference (EMI) detection is a powerful method for EMI diagnosis in high-speed links and multiple signal PCB designs. However, due to the dispersive nature of signal delivery passages and interferences from neighborhood signals, it is very difficult to locate exactly the EMI source of two adjacent traces without contact. In this paper, a noncontact time-domain voltage measurement method is proposed to detect the EMI signals of two adjacent traces on a PCB. A near-field electric probe is employed and a reconstruction algorithm is developed to recover the voltage signals without contact. Through experimental benchmarks, it is demonstrated that the proposed method can successfully recover the common signals, differential signals, and non-correlated signals from the adjacent dual traces. It provides a convenient EMI source measurement method for high-speed and multiple signals PCB diagnosis and optimizations.
Recommended Citation
H. Qiu et al., "Noncontact Time-domain EMI Measurement Of Two Adjacent Traces On A PCB," 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018, article no. 8495320, The Institute of Engineering and Technology, Oct 2018.
The definitive version is available at https://doi.org/10.1109/EMCSI.2018.8495320
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Noncontact; time-domain EMI measurement; two adjacent traces; voltage measurement
International Standard Book Number (ISBN)
978-153866621-0
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 The Institute of Engineering and Technology, All rights reserved.
Publication Date
17 Oct 2018
