Abstract

Nonlinear effects generated in complex electronic systems such as cell phones and computers cause broadband electromagnetic radiations. They are very difficult to model but could be key contributors to the radiated spurious emission (RSE) and radio frequency interference (RFI). In this paper, a novel data-driven characterization method is proposed to analyze the transient responses of the nonlinear circuits and their nonlinear electromagnetic radiations. It employs the dynamic mode decomposition (DMD) to simultaneously extract the temporal patterns and their corresponding dynamic modes. The temporal patterns show high order harmonics generated by the nonlinearity. Then these temporal spatial coherent patterns could provide physical insight of the radiation and fast predictions of future states in nonlinear circuit and electromagnetic systems. Nonlinear benchmarks are provided to demonstrate the validity of the proposed new analysis method. According to our best knowledge, this is the first time RSE and RFI are characterized by DMD, a data-driven method purely based on measured or simulated data.

Department(s)

Electrical and Computer Engineering

Comments

National Natural Science Foundation of China, Grant FA2386-17-1-0010

Keywords and Phrases

Dynamic Mode Decomposition (DMD); Nonlinear Circuits; Nonlinear Electro-magnetic Radiation; Prediction; Reconstruction; Transient Analysis

International Standard Book Number (ISBN)

978-153869199-1

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 The Institute of Engineering and Technology, All rights reserved.

Publication Date

01 Jul 2019

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