Abstract

In this letter, a new deep learning (DL) approach is proposed to solve the electromagnetic inverse scattering (EMIS) problems. The conventional methods for solving inverse problems face various challenges including strong ill-conditions, high contrast, expensive computation cost, and unavoidable intrinsic nonlinearity. To overcome these issues, we propose a new two-step machine learning based approach. In the first step, a complex-valued deep convolutional neural network is employed to retrieve initial contrasts (permittivity's) of dielectric scatterers from measured scattering data. In the second step, the previously obtained contrasts are input into a complex-valued deep residual convolutional neural network to refine the reconstruction of images. Consequently, the EMIS problem can be solved with much higher accuracy even for high-contrast objects. Numerical examples have demonstrated the capability of the newly proposed method with the improved accuracy. The proposed DL approach for EMIS problem serves a new path for realizing real-time quantitative microwave imaging for high-contrast objects.

Department(s)

Electrical and Computer Engineering

Comments

National Natural Science Foundation of China, Grant FA2386-17-1-0010

Keywords and Phrases

Convolutional neural network; electromagnetic inverse scattering (EMIS); high-contrast object; residual learning; two-step process

International Standard Serial Number (ISSN)

1548-5757; 1536-1225

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Nov 2019

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