Abstract
This letter proposes a novel deep learning (DL) approach to resolve the electromagnetic inverse scattering (EMIS) problems. The conventional approaches of resolving EMIS problems encounter assorted difficulties, such as high contrast, high computational cost, inevitable intrinsic nonlinearity, and strong ill-posedness. To surmount these difficulties, a novel DL approach is proposed based on a novel complex-valued deep fully convolutional neural network structure. The proposed complex-valued deep learning model for solving EMIS problems composes of an encoder network and its corresponding decoder network, followed by a final pixel-wise regression layer. The complex-valued encoder network extracts feature fragments from received scattered field data, while the role of the complex-valued decoder network is mapping the feature fragments to retrieve the final contrasts (permittivity's) of dielectric scatterers. Hence, the proposed deep learning model functions as a 'heterogeneous' transformation process, where measured scattering field data is converted into the corresponding contrasts of scatterers. As a consequence, the EMIS problem could be resolved accurately even for extremely high-contrast targets. Numerical benchmarks have illustrated the feasibility and accuracy of our proposed approach. The proposed approach opens a novel path for the deep learning-based real-time quantitative microwave imaging for high-contrast scatterers.
Recommended Citation
H. M. Yao et al., "Enhanced Deep Learning Approach Based On The Deep Convolutional Encoder-Decoder Architecture For Electromagnetic Inverse Scattering Problems," IEEE Antennas and Wireless Propagation Letters, vol. 19, no. 7, pp. 1211 - 1215, article no. 9095348, Institute of Electrical and Electronics Engineers, Jul 2020.
The definitive version is available at https://doi.org/10.1109/LAWP.2020.2995455
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Convolutional neural network; deep learning (DL); electromagnetic inverse scattering (EMIS); high-contrast scatterer
International Standard Serial Number (ISSN)
1548-5757; 1536-1225
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jul 2020
Comments
National Natural Science Foundation of China, Grant FA2386-17-1-0010