Abstract
A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.
Recommended Citation
X. Yan et al., "A Combined Model For Transient And Self-Heating Of Snapback Type ESD Protection Devices," Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Institute of Electrical and Electronics Engineers, Jan 2023.
The definitive version is available at https://doi.org/10.23919/EOS/ESD58195.2023.10287666
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-158537347-5
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2023
Comments
National Science Foundation, Grant IIP-1916535