A generalized simulation model for Rayleigh fading channels with accurate second-order statistics
Abstract
A new sum-of-sinusoids statistical simulation model is proposed for Rayleigh fading channels. The new model employs random path gain, random initial phase, and conditional random Doppler frequency for all individual sinusoids. It is shown that the autocorrelations and cross-correlations of the quadrature components, the autocorrelation of the complex envelope of the new simulator match the desired ones exactly even if the number of sinusoids is as small as a single-digit integer Furthermore, the probability density functions of the fading envelope and phase, the level crossing rate and the average fade duration of the new simulator asymptotically approach the desired ones as the number of sinusoids approaches infinity, while good convergence is achieved when the number of sinusoids is small. Statistical properties of the new simulator are evaluated by numerical results, finding good agreement in all cases.
Recommended Citation
C. Xiao and Y. R. Zheng, "A generalized simulation model for Rayleigh fading channels with accurate second-order statistics," Institute of Electrical and Electronics Engineers (IEEE), Jan 2002.
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Doppler Effect; Rayleigh Channels; Rayleigh Fading Channels; Autocorrelation; Average Fade Duration; Complex Envelope; Conditional Random Doppler Frequency; Convergence; Correlation Methods; Cross-Correlation; Digital Simulation; Fading Envelope; Fading Phase; Generalized Simulation Model; Land Mobile Radio; Level Crossing Rate; Mobile Radio Channels; Probability; Probability Density Functions; Quadrature Components; Random Initial Phase; Random Path Gain; Second-Order Statistics; Simulator; Sinusoids; Statistical Analysis; Sum-Of-Sinusoids Statistical Simulation Model
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2002 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2002